Briec W, K Kerstens, H Leleu and PV Eeckaut (2000). “Returns to Scale on Nonparametric Deterministic Technologies: Simplifying Goodness-of-Fit Methods Using Operations on Technologies.” JPA 14(3): 267-274.
Briec W, K Kerstens, H Leleu and PV Eeckaut (2000). “Returns to Scale on Nonparametric Deterministic Technologies: Simplifying Goodness-of-Fit Methods Using Operations on Technologies.” JPA 14(3): 267-274.
by Ali Emrouznejad & Rajiv Banker
William W Cooper
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Performance Improvement Management Software – PIM-DEA software
Managing Service Productivity : Uses of Frontier Efficiency Methodologies and MCDM for Improving Service Performance, Springer
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Big Data for Greater Good, Springer
Performance Measurement with Fuzzy DEA, Springer
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Strategic Performance Management &
Measurement Using DEA. IGI Global, USA.
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